Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities
This paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs) injection campaigns on Commercial-off-the-shelf (COTS) microprocessors. This method takes advantage of the debug facilities of modern microprocessors along with standard GNU Debugger (GDB) for execut...
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| Altres autors: | , , , |
| Format: | article |
| Idioma: | espanyol |
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2017
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| Accés en línia: | http://revistas.utp.ac.pa/index.php/id-tecnologico/article/view/1432 http://ridda2.utp.ac.pa/handle/123456789/1781 |
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| _version_ | 1869652460899926016 |
|---|---|
| author | Isaza-González, José |
| author2 | Serrano-Cases, Alejandro Restrepo-Calle, Felipe Cuenca-Asensi, Sergio Martínez-Álvarez, Antonio |
| author2_role | author author author author |
| author_browse | Cuenca-Asensi, Sergio Isaza-González, José Martínez-Álvarez, Antonio Restrepo-Calle, Felipe Serrano-Cases, Alejandro |
| author_facet | Isaza-González, José Serrano-Cases, Alejandro Restrepo-Calle, Felipe Cuenca-Asensi, Sergio Martínez-Álvarez, Antonio |
| author_role | author |
| collection | Repositorio Institucional de documento digitales de acceso abierto de la UTP |
| dc.contributor.none.fl_str_mv | |
| dc.creator.none.fl_str_mv | Isaza-González, José Serrano-Cases, Alejandro Restrepo-Calle, Felipe Cuenca-Asensi, Sergio Martínez-Álvarez, Antonio |
| dc.date.none.fl_str_mv | 2017-06-06 2017-07-28T13:57:00Z 2017-07-28T13:57:00Z |
| dc.format.none.fl_str_mv | application/pdf |
| dc.identifier.none.fl_str_mv | http://revistas.utp.ac.pa/index.php/id-tecnologico/article/view/1432 http://ridda2.utp.ac.pa/handle/123456789/1781 |
| dc.language.none.fl_str_mv | spa |
| dc.publisher.none.fl_str_mv | Universidad Tecnológica de Panamá |
| dc.relation.none.fl_str_mv | http://revistas.utp.ac.pa/index.php/id-tecnologico/article/view/1432/1994 |
| dc.rights.none.fl_str_mv | info:eu-repo/semantics/openAccess https://creativecommons.org/licenses/by-nc-sa/4.0/ |
| dc.source.none.fl_str_mv | 2219-6714 1680-8894 I+D Tecnológico; Vol. 13, Núm. 1 (2017): Revista I+D Tecnológico; 8-17 reponame:Repositorio Institucional de documento digitales de acceso abierto de la UTP instname:Universidad Tecnológica de Panamá instacron:U Tecnológica de Panamá |
| dc.subject.none.fl_str_mv | Commercial-off-the-shelf (COTS); on-chip debug; radiation effects; microprocessors reliability; fault injection; soft-error Commercial-off-the-shelf (COTS); depuración integrada en el chip; efectos de la radiación; fiabilidad de microprocesadores; inyección de fallos; errores lógicos |
| dc.title.none.fl_str_mv | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities Evaluación de la fiabilidad de microprocesadores COTS mediante las infraestructuras de depuración On-Chip |
| dc.type.none.fl_str_mv | info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion |
| description | This paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs) injection campaigns on Commercial-off-the-shelf (COTS) microprocessors. This method takes advantage of the debug facilities of modern microprocessors along with standard GNU Debugger (GDB) for executing and debugging benchmarks. The developed experiments on real boards, as well as on virtual machines, demonstrate the feasibility and flexibility of the proposal as a low-cost solution for assessing the reliability of COTS microprocessors |
| eu_rights_str_mv | openAccess |
| format | article |
| id | lrtest_4016ed854bb4cc31e9d791c22777affc |
| instacron_str | U Tecnológica de Panamá |
| institution | U Tecnológica de Panamá |
| instname_str | Universidad Tecnológica de Panamá |
| language | spa |
| network_acronym_str | lrtest |
| network_name_str | lr |
| oai_identifier_str | oai:ridda2.utp.ac.pa:123456789/1781 |
| publishDate | 2017 |
| publishDateSort | 2017 |
| publisher.none.fl_str_mv | Universidad Tecnológica de Panamá |
| reponame_str | Repositorio Institucional de documento digitales de acceso abierto de la UTP |
| repository.mail.fl_str_mv | |
| repository.name.fl_str_mv | |
| repository_id_str | |
| rights_invalid_str_mv | https://creativecommons.org/licenses/by-nc-sa/4.0/ |
| spelling | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilitiesEvaluación de la fiabilidad de microprocesadores COTS mediante las infraestructuras de depuración On-ChipIsaza-González, JoséSerrano-Cases, AlejandroRestrepo-Calle, FelipeCuenca-Asensi, SergioMartínez-Álvarez, AntonioCommercial-off-the-shelf (COTS); on-chip debug; radiation effects; microprocessors reliability; fault injection; soft-errorCommercial-off-the-shelf (COTS); depuración integrada en el chip; efectos de la radiación; fiabilidad de microprocesadores; inyección de fallos; errores lógicosThis paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs) injection campaigns on Commercial-off-the-shelf (COTS) microprocessors. This method takes advantage of the debug facilities of modern microprocessors along with standard GNU Debugger (GDB) for executing and debugging benchmarks. The developed experiments on real boards, as well as on virtual machines, demonstrate the feasibility and flexibility of the proposal as a low-cost solution for assessing the reliability of COTS microprocessorsEste artículo presenta una herramienta de inyección de fallos y la metodología para la realización de campañas de inyección de Single-Event-Upsets (SEUs) en microprocesadores Commercial-off-the-shelf (COTS). Este método utiliza las ventajas que ofrecen las infraestructuras de depuración de los microprocesadores actuales, además del depurador estándar de GNU (GDB) para la ejecución y depuración de los programas de pruebas. Los experimentos desarrollados sobre microprocesadores reales, así como en las máquinas virtuales, demuestran la viabilidad y la flexibilidad de la propuesta como una solución de bajo costo para evaluar la fiabilidad de los microprocesadores COTSUniversidad Tecnológica de Panamá2017-06-062017-07-28T13:57:00Z2017-07-28T13:57:00Zinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfhttp://revistas.utp.ac.pa/index.php/id-tecnologico/article/view/1432http://ridda2.utp.ac.pa/handle/123456789/17812219-67141680-8894I+D Tecnológico; Vol. 13, Núm. 1 (2017): Revista I+D Tecnológico; 8-17reponame:Repositorio Institucional de documento digitales de acceso abierto de la UTPinstname:Universidad Tecnológica de Panamáinstacron:U Tecnológica de Panamáspahttp://revistas.utp.ac.pa/index.php/id-tecnologico/article/view/1432/1994info:eu-repo/semantics/openAccesshttps://creativecommons.org/licenses/by-nc-sa/4.0/oai:ridda2.utp.ac.pa:123456789/17812019-12-06T14:50:28Z |
| spellingShingle | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities Isaza-González, José Commercial-off-the-shelf (COTS); on-chip debug; radiation effects; microprocessors reliability; fault injection; soft-error Commercial-off-the-shelf (COTS); depuración integrada en el chip; efectos de la radiación; fiabilidad de microprocesadores; inyección de fallos; errores lógicos |
| status_str | publishedVersion |
| title | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities |
| title_full | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities |
| title_fullStr | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities |
| title_full_unstemmed | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities |
| title_short | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities |
| title_sort | Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities |
| topic | Commercial-off-the-shelf (COTS); on-chip debug; radiation effects; microprocessors reliability; fault injection; soft-error Commercial-off-the-shelf (COTS); depuración integrada en el chip; efectos de la radiación; fiabilidad de microprocesadores; inyección de fallos; errores lógicos |
| url | http://revistas.utp.ac.pa/index.php/id-tecnologico/article/view/1432 http://ridda2.utp.ac.pa/handle/123456789/1781 |